CERN Accelerating science

An Automated Security & Robustness Testing Environment for Industrial Devices

Author(s): 
F. Tilaro
Date presented: 
Friday, 22 April, 2011
Event presented at: 
openlab III Minor Review Meeting, 22 March, CERN
Presentation file: 
PDF icon An Automated Security & Robustness Testing Environment for Industrial Devices_FTilaro.pdf